低边FET驱动型 单节锂电池保护IC

输入电压

VDD – VSS = 1.5 V to 5.0 V

VDD – VVM = 0 V to 5.5 V

(Maximum Rating: 12 V)

元件数

1

电源电流

Typ. 1.50 µA / Max. 3.00 µA

(TDET: Disabled)

Typ. 2.00 µA / Max. 4.00 µA

(TDET: Enabled)

待机电流

Max. 0.20 µA

(VDET2: Auto release Type)

Max. 0.04 µA

(VDET2: Non-Auto release Type)

过充电

检测电压

3.6 V to 4.8 V (0.005 V Step)

过充电

检测电压精度

±10 mV

过充电检测

延迟时间

1024 ms, 4096 ms

过放电

检测电压

2.0 V to 3.4 V

(0.005 V Step)

过放电检测

电压精度

±35 mV

过放电检测

延迟时间

32 ms, 64 ms, 128 ms

放电过电流

检测电压

VDET31: 0.0050 V to 0.0800 V

(0.0005 V Step)

VDET32: 0.0100 V to 0.1000 V

(0.0005 V Step)

放电过电流

检测电压精度

VDET31:

±1.0 mV

(0.0050 V to 0.0300 V),

±1.5 mV

(0.0305 V to 0.0500 V),

±2.0 mV

(0.0505 V to 0.0800 V)

VDET32:

±2.0 mV

(0.0100 V to 0.0600 V),

±3.0 mV

(0.0605 V to 0.1000 V)

放电过电流检测

延迟时间

VDET31:

8 ms, 16 ms, 32 ms, 512 ms, 1024 ms, 4096 ms

VDET32:

8 ms, 16 ms

充电过电流

检测电压

–0.0800 V to –0.0050 V

(0.0005 V Step)

充电过电流

检测电压精度

±1.0 mV

(–0.0050 V to –0.0300 V),

±1.5 mV

(–0.0305 V to –0.0500 V),

±2.0 mV

(–0.0505 V to –0.0800 V)

充电过电流检测

延迟时间

8 ms, 16 ms

短路

检测电压

0.0200 V to 0.2000 V

(0.0005 V Step)

短路检测

电压精度

±3.0 mV

(0.0200 V to 0.120 V),

±5.0 mV

(0.1205 V to 0.200 V)

检测延迟时间短

0.28 ms, 0.53 ms, 1.1 ms, 2.1 ms

恢复过充的条件

Selectable: Auto Release1 / Auto Release2 / Latch

恢复过放电的条件

Selectable:

Auto Release / Latch / Latch2 / Latch3(Slope)

封装

WLCSP-8-ZA3

0 V Battery Charging

Selectable: Permission / Inhibition